Adaptively controlling low power mode operation for a cache memory

ABSTRACT

In an embodiment, a processor includes a plurality of cores each to independently execute instructions, a cache memory including a plurality of portions distributed across a die of the processor, a plurality of sleep circuits each coupled to one of the portions of the cache memory, and at least one sleep control logic coupled to the cache memory portions to dynamically determine a sleep setting independently for each of the sleep circuits and to enable the corresponding sleep circuit to maintain the corresponding cache memory portion at a retention voltage. Other embodiments are described and claimed.

TECHNICAL FIELD

Embodiments relate to power management of a system, and moreparticularly to power management for a cache memory of a multicoreprocessor.

BACKGROUND

Advances in semiconductor processing and logic design have permitted anincrease in the amount of logic that may be present on integratedcircuit devices. As a result, computer system configurations haveevolved from a single or multiple integrated circuits in a system tomultiple hardware threads, multiple cores, multiple devices, and/orcomplete systems on individual integrated circuits. Additionally, as thedensity of integrated circuits has grown, the power requirements forcomputing systems (from embedded systems to servers) have alsoescalated. Furthermore, software inefficiencies, and its requirements ofhardware, have also caused an increase in computing device energyconsumption. In fact, some studies indicate that computing devicesconsume a sizeable percentage of the entire electricity supply for acountry, such as the United States of America. As a result, there is avital need for energy efficiency and conservation associated withintegrated circuits. These needs will increase as servers, desktopcomputers, notebooks, Ultrabooks™, tablets, mobile phones, processors,embedded systems, etc. become even more prevalent (from inclusion in thetypical computer, automobiles, and televisions to biotechnology).

A cache memory as may be used in a processor or otherwise within asystem achieves leakage power reduction by putting un-accessed portionsof the cache memory in a low power or sleep state by reducing a localvoltage in a retention mode. This is accomplished by a series ofswitches inserted between the portion of the cache memory itself and apower supply. The number of switches that are turned on is modulated toachieve the desired voltage droop. The sleep setting of these switchesis a function of the process, temperature and operating voltage. At highoperating voltages, the sleep voltage droop may be higher than at loweroperating voltages, while at even lower operating voltages (close to aretention voltage) the sleep function is disabled altogether, as thelocal voltage supply cannot drop below the retention voltage value.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a block diagram of a system in accordance with one embodimentof the present invention.

FIG. 2 is a flow diagram of a high level view of a method for performingcalculations for controlling power consumption of a cache portion inaccordance with an embodiment of the present invention.

FIG. 3 is a flow diagram of a method for determining an optimal sleepsetting in accordance with an embodiment of the present invention.

FIG. 4 is a block diagram of a sleep circuit in accordance with anembodiment of the present invention.

FIG. 5 is a flow diagram of a method for controlling a sleep circuit fora cache portion in accordance with an embodiment.

FIG. 6 is a block diagram of a processor in accordance with anembodiment of the present invention.

FIG. 7 is a block diagram of a multi-domain processor in accordance withanother embodiment of the present invention.

FIG. 8 is a block diagram of a processor including multiple cores inaccordance with an embodiment of the present invention.

FIG. 9 is a block diagram of a system in accordance with an embodimentof the present invention.

FIG. 10 is a block diagram of a processor in accordance with anotherembodiment of the present invention.

DETAILED DESCRIPTION

Embodiments may dynamically and independently determine an optimal sleepsetting for a plurality of sleep circuits each associated with acorresponding cache memory portion, such as distributed portions of ashared cache memory of a multicore processor. More specifically, anoptimal sleep setting may be calculated for each individual cacheportion (e.g., cache slice) and driven to the respective portions. At ahigh level, the technique includes calculation of local process, voltageand temperature conditions for each cache slice, and then use of theseconditions to calculate sleep settings independently and dynamically foreach sleep circuit that maximizes the leakage savings for each slice.

Referring now to FIG. 1, shown is a block diagram of a portion of asystem in accordance with an embodiment of the present invention. Asshown in FIG. 1, system 100 may include various components, including aprocessor 110 which as shown is a multicore processor. Processor 110 maybe coupled to a power supply 150 via an external voltage regulator 160,which may perform a first voltage conversion to provide a primaryregulated voltage to processor 110.

As seen, processor 110 may be a single die processor including multiplecores 120 _(a)-120 _(n). In addition, each core may be associated withan integrated voltage regulator (IVR) 125 _(a)-125 _(n) which receivesthe primary regulated voltage and generates an operating voltage to beprovided to one or more agents of the processor associated with the IVR.Accordingly, an IVR implementation may be provided to allow forfine-grained control of voltage and thus power and performance of eachindividual core. As such, each core can operate at an independentvoltage and frequency, enabling great flexibility and affording wideopportunities for balancing power consumption with performance.

Still referring to FIG. 1, additional components may be present withinthe processor including an input/output interface 132, another interface134, and an integrated memory controller 136. As seen, each of thesecomponents may be powered by another integrated voltage regulator 125_(x). In one embodiment, interface 132 may be in accordance with theIntel® Quick Path Interconnect (QPI) protocol, which provides forpoint-to-point (PtP) links in a cache coherent protocol that includesmultiple layers including a physical layer, a link layer and a protocollayer. In turn, interface 134 may be in accordance with a PeripheralComponent Interconnect Express (PCIe™) specification, e.g., the PCIExpress™ Specification Base Specification version 2.0 (published Jan.17, 2007).

Also shown is a power control unit (PCU) 138, which may includehardware, software and/or firmware to perform power managementoperations with regard to processor 110. As seen, PCU 138 providescontrol information to external voltage regulator 160 via a digitalinterface to cause the voltage regulator to generate the appropriateregulated voltage. PCU 138 also provides control information to IVRs 125via another digital interface to control the operating voltage generated(or to cause a corresponding IVR to be disabled in a low power mode). Invarious embodiments, PCU 138 may include logic to dynamically andindependently calculate and control sleep settings for sleep circuitryassociated with different cache memory portions.

While not shown for ease of illustration, understand that additionalcomponents may be present within processor 110 such as uncore logic, andother components such as internal memories, e.g., one or more levels ofa cache memory hierarchy and so forth. Furthermore, while shown in theimplementation of FIG. 1 with an integrated voltage regulator,embodiments are not so limited.

Although the following embodiments are described with reference toenergy conservation and energy efficiency in specific integratedcircuits, such as in computing platforms or processors, otherembodiments are applicable to other types of integrated circuits andlogic devices. Similar techniques and teachings of embodiments describedherein may be applied to other types of circuits or semiconductordevices that may also benefit from better energy efficiency and energyconservation. For example, the disclosed embodiments are not limited toany particular type of computer systems, and may be also used in otherdevices, such as handheld devices, systems on chip (SoCs), and embeddedapplications. Some examples of handheld devices include cellular phones,Internet protocol devices, digital cameras, personal digital assistants(PDAs), and handheld PCs. Embedded applications typically include amicrocontroller, a digital signal processor (DSP), network computers(NetPC), set-top boxes, network hubs, wide area network (WAN) switches,or any other system that can perform the functions and operations taughtbelow. Moreover, the apparatus′, methods, and systems described hereinare not limited to physical computing devices, but may also relate tosoftware optimizations for energy conservation and efficiency. As willbecome readily apparent in the description below, the embodiments ofmethods, apparatus′, and systems described herein (whether in referenceto hardware, firmware, software, or a combination thereof) are vital toa ‘green technology’ future, such as for power conservation and energyefficiency in products that encompass a large portion of the US economy.

Note that the dynamic and independent cache memory low powercalculations and control described herein may be independent of andcomplementary to an operating system (OS)-based mechanism, such as theAdvanced Configuration and Platform Interface (ACPI) standard (e.g.,Rev. 3.0b, published Oct. 10, 2006). According to ACPI, a processor canoperate at various performance states or levels, namely from P0 to PN.In general, the P1 performance state may correspond to the highestguaranteed performance state that can be requested by an OS. In additionto this P1 state, the OS can further request a higher performance state,namely a P0 state. This P0 state may thus be an opportunistic or turbomode state in which, when power and/or thermal budget is available,processor hardware can configure the processor or at least portionsthereof to operate at a higher than guaranteed frequency. In manyimplementations a processor can include multiple so-called binfrequencies above the P1 guaranteed maximum frequency, exceeding to amaximum peak frequency of the particular processor, as fused orotherwise written into the processor during manufacture. In addition,according to ACPI, a processor can operate at various power states orlevels. With regard to power states, ACPI specifies different powerconsumption states, generally referred to as C-states, C0, C1 to Cnstates. When a core is active, it runs at a C0 state, and when the coreis idle it may be placed in a core low power state, also called a corenon-zero C-state (e.g., C1-C6 states), with each C-state being at alower power consumption level (such that C6 is a deeper low power statethan C1, and so forth).

To be able to enter into a sleep state for a cache memory, a supplyvoltage provided to the cache memory is in excess of a sleep thresholdvoltage: if the supply voltage exceeds this threshold, the sleepfunction is enabled and if it is below this voltage, a sleep function isdisabled. Note that the sleep setting is a strong function oftemperature, since the sleep voltage droop across a sleep circuit isdetermined by the total leakage of the cache memory and the resistanceof the sleep circuit as enabled. Finally, the sleep setting varies fromdie to die (and as described below across a die), depending on processcorner within-die variations.

In large server processors, shared cache memory sub-arrays or slices aredistributed all over the die, with a portion of the cache associatedwith each processor core. Since the die area is relatively large, it isdifficult to determine a sleep setting that is optimal for all cacheslices on the die. For example, one corner of the die can have a fasterprocess than the opposite corner, due to within-die variations. Further,temperature can vary by 20-30° Celsius across the die, which impacts thevoltage droop for the sleep function. The cache voltage can also changeunder normal operation, which compels an adjustment in the sleepsettings. Therefore, having a conventional single fuse-based staticsleep setting does not maximize power savings.

Thus embodiments realize an adaptive sleep mode in which sleep settingsare calculated by a control logic such as a power controller of theprocessor. These sleep settings are independently and dynamicallycalculated for each cache slice to compensate for process, voltage andtemperature variations across the die, enabling each cache slice toenter into sleep states closer to the retention voltage for thatparticular slice and therefore save leakage power.

In an embodiment the power controller dynamically calculates a localoperating voltage (supply voltage minus the droop across a correspondingsleep circuit) and sleep strength setting for each cache slice. In manyembodiments, setting the granularity to a slice basis is a goodtrade-off to account for process, voltage and temperature variationsacross the die. Of course in other embodiments, smaller granularity(like groups of sub-arrays within each slice) calculations andindependent control may be realized.

The retention voltage and the actual operating voltage may be used todetermine if the sleep function is to be enabled for a given cacheportion. In an embodiment, the PCU determines the retention voltage foreach cache slice using the local process, voltage and temperature foreach cache slice.

Referring now to FIG. 2, shown is a flow diagram of a high level view ofa method for performing calculations for controlling power consumptionof a cache portion in accordance with an embodiment of the presentinvention. As shown in FIG. 2, method 200 may be performed by a powercontroller of a processor such as a PCU or other control logic. Forexample, in other embodiments, rather than a central power controller ofa processor, programmable logic such as a finite state machine may bereplicated in multiple locations (such as within each core, cache memoryor other agent) to allow a multicore processor to perform the method ofFIG. 2 in a distributed manner.

As shown in FIG. 2, method 200 may be used to dynamically determine aretention voltage and sleep settings for a corresponding sleep circuitfor a given portion of a cache memory such as a shared cache memory. Forexample, in an embodiment method 200 may be performed for each slice ofa shared cache memory. Of course, different granularities are possibleand the control method may be performed on a sub-slice basis such as fora given sub-array of the slice (or on a coarser granularity such as formultiple slices). Furthermore, while a distributed cache memory having aslice-based configuration is described herein for example purposes,understand that a distributed cache memory may have different portionsdistributed across a die in a variety of different manners.

In general, method 200 may be used to determine a retention voltage foreach cache portion using local process, voltage and temperature (P,V,T)for each cache portion. First, a process determination 210, atemperature determination 220, and a voltage determination 230 mayoccur. Note that these determinations may be made in any order and canbe made at different time intervals. For example, process determination210 may be calculated for each cache slice to enable determination ofvariations across die once at power on and its corresponding determinedvalue stored for later usage. Temperature determination 220 and voltagedetermination 230 may be performed periodically.

For process determination 210, which may be performed on power on of asystem including a processor, each of multiple test (e.g., process)sensors associated with a slice may be read (block 212). For example, agiven cache slice may include multiple ring oscillators located atvarious positions throughout the slice. As an example, each slice mayinclude between approximately 25 and 50 ring oscillators. When enabledduring process determination 210, each of these ring oscillators mayoperate, generating a clock signal at a given frequency. Thesecorresponding clock signal frequencies are input into a counter and itsoutput may then be provided, e.g., via a serial bus to the PCU. Next, atblock 214 the process sensors may be averaged depending on theirphysical location with respect to each cache slice. Understand that inother embodiments, instead of a ring oscillator another type of processsensor such as a critical path replica may be used.

Next, based on the average frequency determined for the given slice, aprocess corner for the slice may be determined (block 216). As anexample, a lookup table may be present in the PCU that includes aplurality of entries each associating a corresponding operatingfrequency with a given process corner. For example, if the operatingfrequency (as determined in block 214) is higher than a predeterminedvalue, the process corner may be considered to be of a fast processcorner and correspondingly, if the operating frequency for a given sliceis less than a certain value, the cache slice may be considered to be ofa slow process corner. Although not shown for ease of illustration,understand that the determined process corner value may be stored in anappropriate storage such as a table storage in a memory of or associatedwith PCU. This process corner memory may include a plurality of entrieseach associated with a given cache slice and each identifying a processcorner value for the corresponding cache slice (e.g., fast processcorner, typical process corner, slow process corner, or intermediatepoints in between). Note that process determination 210 may be performedfor every cache slice, e.g., on power up. Of course in otherembodiments, the process corner determination may take place at othertimes as appropriate.

Still referring to FIG. 2, temperature determination 220 may beperformed on a more regular interval, e.g., every 1 millisecond (ms). Toenable determination of variations across die, temperature determination220 may be performed for each cache slice. First, at block 222 localtemperature sensors may be read in neighboring cores. That is, in anexample embodiment temperature sensors may be located in coresassociated with slices, rather than within the cache slices themselves.Of course in another implementation, one or more local temperaturesensors may be present within the cache slices themselves. In any event,these local temperature sensors are read and at block 224 the values areused to generate an average temperature value. Note that this averagetemperature value may take into account different weightings for thetemperature values based on proximity of a given core to thecorresponding slice. From this average, at block 226 a local temperaturemay be determined. As above with the process determination thetemperature determination may be made for each cache slice. And as withthe process corner determination the local thermal values may be storedin a storage, e.g., a table storage implemented as a thermal memoryincluding a plurality of entries each associated with a given cacheslice and each identifying a temperature value for the correspondingcache slice.

Still referring to FIG. 2, voltage determination 230 also may beperformed. In an embodiment, voltage determination 230 may be performedeach time an operating voltage changes for a given cache slice. Ingeneral, voltage determination 230 may be performed by determining alocal operating voltage. This determination may be made, e.g., based onthe PCU's knowledge of the operating voltage it instructed for a givenslice. Alternately, a local voltage sensor circuit can be used and adigital voltage output is transmitted to the PCU. Accordingly, at thispoint process, temperature and voltage information is available for eachcache slice.

Next, a retention voltage may be calculated for each cache slice basedon this process, voltage and temperature information (block 240).Furthermore, an optimal sleep setting for a sleep circuit associatedwith each cache slice may be determined at block 250. Here, an optimalsleep strength is calculated using the same process, temperature andvoltage values calculated before. In one embodiment, there are 16 sleepsettings (via a 4-bit control signal) that can be used to control anoperating voltage provided to the corresponding cache portion.

Note that the retention voltage determination and sleep settingdetermination may be performed in an iterative manner until the optimalsleep setting value is obtained. Furthermore, understand that thetemperature and voltage determinations may continually be updated, e.g.,according to a predetermined interval (e.g., 1 ms) for the temperaturedetermination, and anytime an operating voltage change occurs for thevoltage determination. Although shown at this high level in theembodiment of FIG. 2, understand the scope of the present invention isnot limited in this regard.

Referring now to FIG. 3, shown is a flow diagram of a method fordetermining an optimal sleep setting for a sleep circuit in accordancewith an embodiment of the present invention. As shown in FIG. 3, method260 may similarly be performed by a power controller such as a PCU orother programmable logic, e.g., associated with a given cache portion.Method 260 begins by calculating an operating voltage and retentionvoltage (block 265). Here the calculation of operating voltage andretention voltage may be performed with the sleep circuit disabled. Ingeneral the operating voltage provided to the cache portion may be thesame as the operating voltage for the corresponding processor core,e.g., Vcc. The retention voltage is thus initialized with all sleeptransistors turned off (no sleep).

Still referring to FIG. 3, at diamond 270 it may be determined whetherthe operating voltage is greater than a threshold value. In anembodiment, this threshold value may correspond to a retention voltagevalue and a margin. This threshold value ensures that the operatingvoltage for the cache slice is high enough to support sleep (note thatto accurately retain information stored in the cache memory, theoperating voltage exceeds the retention voltage by a programmablemargin). As an example, this margin may be between approximately 30 and50 millivolts, in an embodiment.

If it is determined that the operating voltage is greater than thisthreshold value, control passes to block 275 where a sleep setting valuemay be incremented (e.g., by one step). This sleep setting value may bea digital code that is used to control a sleep circuit, details of whichare described further below. By implementing this sleep setting, atleast a portion of the sleep circuit is enabled to a create a sleepdroop in the operating voltage, causing the operating voltage for thecache memory portion to be less than the operating voltage provided tothe core/slice. In one embodiment, for a given sleep circuit the PCUstarts from the weakest setting and incrementally increases the sleepsetting until the actual operating voltage provided to the cache portion(after the effect of the at least partially enabled sleep circuit) isjust above the retention voltage (within a programmable margin). Theretention voltage is a function of the sleep setting, process, andtemperature and may be calculated iteratively for each new sleepsetting. Due to this change in sleep setting, a new retention voltageand operating voltage is determined at block 280. Thereafter, controlpasses back to diamond 270, discussed above. The local operating voltagefor a cache slice is the main supply voltage (known to the PCU) minusthe voltage droop on the sleep circuit (calculated from a table lookupbased on the local PVT data, in an embodiment) and may be in accordancewith the following equations:SRAM_VCC=VCC−SleepTransDroop(SleepStrength,Process,Temp)SRAM_VCC≧VbaseRetention(Voltage,Process,Temp)where VCC is the supply voltage, SRAM_VCC is the operating voltage ofthe cache memory portion, SleepTransDroop is the voltage droop acrossthe sleep circuit, and VbaseRetention is the minimum retention voltage(taking into account some margin).

Still referring to FIG. 3, if instead it is determined at diamond 270that the operating voltage is not greater than the threshold value,control passes to block 285. There, the sleep setting value may bedecremented (block 285). With a decremented sleep setting, less of thesleep circuit is enabled and as such, a greater operating voltageapplied to the cache slice is realized. And at block 290 a new retentionvoltage and operating voltage may be determined. Finally, at block 295if the sleep setting is at its lowest value (a disabled sleep value) apause state may occur to allow conditions to potentially change. Forexample, such a change can be a new operating voltage (which istriggered by the PCU) or a large local temperature change (which ismonitored by the PCU). Understand that while shown with this high levelview in the embodiment of FIG. 3, the scope of the present invention isnot limited in this regard.

In another implementation a logic state machine to implement the sleepsetting determination may be configured in hardware in each cache slicefor processors that do not have a PCU (like many SoC designs). In eitherevent, instead of using a single set of static sleep settings to controlall sleep circuits, to reduce cache memory leakage independent adaptivesettings are used for each sleep circuit to maximize power savings inthe face of increasing PVT variations across the die.

In one embodiment, dynamic sleep settings are provided to a sleepcircuit such as shown in FIG. 4, which is a block diagram of a sleepcircuit in accordance with an embodiment of the present invention. Asshown in FIG. 4, circuit 300 is a sleep circuit that includes aplurality of transistor legs 310 ₀-310 _(n), each including one or moretransistors, e.g., metal oxide semiconductor field effect transistors(MOSFETs). In the embodiment shown leg 310 ₀ includes PMOS devicesP₀₁-P₀₂, leg 310 ₁ includes PMOS devices P₁-P₁₂, leg 310 ₂ includes PMOSdevices P₂₁-P₂₂ and leg 310 _(n) includes PMOS devices P_(n1)-P_(n2). Asimilar scheme may be implemented using NMOS devices. By using differentamounts of transistors in each leg, finer granularities of resistancemay be provided by way of the sleep circuit. As seen, each of thesetransistors of the transistor legs are controlled by a control signaloutput by a multiplexer 330. More specifically, multiplexer 330 receivesincoming sleep settings, e.g., in the form of a digital code, namely afour-bit sleep transistor setting (ST_Setting<3:0>). Furthermore,multiplexer 330 receives a static fuse value which may be a singleglobal fixed static value, which is stored into the processor duringmanufacturing testing based on characterization or in anothermanufacturing stage. Multiplexer 330 may be controlled, e.g., by the PCUto provide either this static fuse setting or an adaptive sleep settingvalue, generated e.g., by the PCU or by a logic state machine associatedwith the cache portion.

Thus based on control of these transistor legs, a sleep transistor droopvoltage is effected, thus reducing the supply voltage VCC at a supplyvoltage node to a lower operating voltage, SRAM_VCC, at a cacheoperating voltage node, to be provided to a cache memory array 345 whichcorresponds to a cache slice. In general, when controlled to be in asleep state, the sleep setting output by multiplexer 330 controls sleepcircuit 300 and causes this operating voltage to be at a level at leastequal to a retention voltage.

Note further in FIG. 4 the presence of a bypass circuit 320. Bypasscircuit 320 includes a decoder 325 coupled to receive the sleep settingoutput by multiplexer 330. When this sleep setting is of a particularcode (e.g., all zeros), indicating that no sleep setting is to beprovided, decoder 325 provides a control signal to enable a transistorP0 (which in an embodiment may be a much larger size than thetransistors of transistor legs 310) to provide a short circuit betweenthe supply voltage node Vcc and the cache operating voltage node coupledto cache memory array 345, thus providing a fast path to enable the fulloperating voltage to be provided to the cache memory when the cachememory is active (e.g., performing read and/or write operations).Understand that while shown with the particular implementation in theembodiment of FIG. 4, alternatives are possible.

In an embodiment, the PCU can be coupled via intermediate agents such asrepeater stations to a corresponding power management agent within eachtile of a multicore processor, where each tile includes one or morecores, a corresponding cache portion and other circuitry associated withthe core. Communications may be made by the PCU via a serial bus suchthat information for a particular tile can be communicated by providingan address for the corresponding power management agent and followingthat address with message information. For purposes of discussionherein, understand that for each tile the PCU may calculate anappropriate sleep setting dynamically and independently, and via thisserial bus communicate the sleep setting as data following an addressfor a particular power management agent. Once received by the powermanagement agent, the sleep setting is provided to a corresponding sleepcircuit, e.g., via an intervening multiplexer such as described abovewith regard to FIG. 4. In an embodiment, the PCU staggers communicationof changes in sleep settings across groups of cores, in order to avoidcreating di/dt events.

The power reduction benefits using an embodiment may be realized by theability to adjust sleep settings independently and adaptively for eachcache slice (slowly, but in real time) to track local temperaturechanges. Embodiments may realize substantial power savings in amulticore processor with a distributed shared cache memory havingportions with independently controllable operating voltages as describedherein. Embodiments may implement a PCU-driven adaptive leakagereduction technique that optimally configures sleep circuits associatedwith each cache slice to maximize the leakage savings for the localprocess, voltage and temperature conditions.

Referring now to FIG. 5, shown is a flow diagram of a method forcontrolling a sleep circuit for a cache portion in accordance with anembodiment. In the embodiment of FIG. 5, method 350 may be performed bya PCU for control of a single sleep circuit associated with one cacheportion. Understand that this method may be performed for each suchsleep circuit associated with the different cache portions. Of course inother embodiments, other logic such as distributed logic or otherhardware associated with each cache portion may perform the method.

In FIG. 5, method 350 begins by determining whether a cache portion isactive (diamond 355). In an embodiment this determination may be basedon whether a read, write or other access to the cache portion hasoccurred within a predetermined time interval. For example, a timer maybe associated with each cache portion to count inactivity duration suchthat upon expiration of the timer, the cache portion may be consideredto be inactive. If the cache portion is active, method 350 concludes asa retention voltage would be insufficient to power the cache memory foractive operations. Otherwise, control passes next to diamond 360 whereit can be determined whether the sleep circuit is to be controlleddynamically or statically. As described above, a single global staticsleep setting may be present, e.g., via a fuse value, in addition to thedynamic setting determined as described herein. This determination ofstatic or dynamic control may be based, e.g., on a setting provided byway of system software, e.g., BIOS, that in turn may be under usercontrol. Of course in other embodiments the static/dynamic determinationmay be based, e.g., on processor activity or so forth.

If dynamic control is indicated, control passes to block 365 where adynamically determined optimal sleep setting may be communicated alongwith a dynamic control signal to a power management agent associatedwith the cache portion, e.g., to enable control of a multiplexer orother selection circuitry associated with the sleep circuit to providethe dynamic sleep setting to the sleep circuit. Otherwise, at block 370when static control is indicated, a static optimal sleep setting (e.g.,originating from fuses or a static setting determined by the PCU) may becommunicated along with a static control signal to the power managementagent, e.g., to enable control of a multiplexer or other selectioncircuitry associated with the sleep circuit to provide the static sleepsetting to the sleep circuit.

From both of blocks 365 and 370 control passes to diamond 375 todetermine whether a change in temperature or operating voltage hasoccurred. If so, control passes to block 380 for a recalculation of anoptimal sleep setting, as described herein and method 350 may againproceed. If no such change is determined, next it can be determinedwhether the cache portion is to be activated (diamond 385). Thisdetermination may be based upon an indication that cache activity hasbeen requested or is about to occur for the cache portion. If so,control passes to block 390 where a sleep disable command iscommunicated to the power management agent. This sleep disable commandclears the sleep setting provided, causing the full operating voltage tobe provided to the cache memory, thus raising the voltage from aretention voltage to a sufficient operating voltage to enable cacheaccess operations to occur. Although described at this high level in theembodiment of FIG. 5, understand the scope of the present invention isnot limited in this regard.

Embodiments can be implemented in processors for various marketsincluding server processors, desktop processors, mobile processors andso forth. Referring now to FIG. 6, shown is a block diagram of aprocessor in accordance with an embodiment of the present invention. Asshown in FIG. 6, processor 400 may be a multicore processor including aplurality of cores 410 _(a)-410 _(n). In one embodiment, each such coremay be of an independent power domain and can be configured to enter andexit active states and/or maximum performance states based on workload.The various cores may be coupled via an interconnect 415 to a systemagent or uncore 420 that includes various components. As seen, theuncore 420 may include a shared cache 430 which may be a last levelcache, and which may be distributed so that individual cache slices arelocated in close proximity to a corresponding core. In addition, theuncore may include an integrated memory controller 440, variousinterfaces 450 and a power control unit 455. In various embodiments,power control unit 455 may include an adaptive cache memory low powercontrol logic 459 in accordance with an embodiment of the presentinvention. Using this logic, independent and dynamic optimal sleepsettings can be determined and communicated to corresponding sleepcircuits each associated with a distributed cache slice portion. Inanother embodiment, each cache slice may include a local state machinethat determines the local process, voltage and temperature and drivesthe sleep settings for that particular cache slice.

With further reference to FIG. 6, processor 400 may communicate with asystem memory 460, e.g., via a memory bus. In addition, by interfaces450, connection can be made to various off-chip components such asperipheral devices, mass storage and so forth. While shown with thisparticular implementation in the embodiment of FIG. 6, the scope of thepresent invention is not limited in this regard.

Referring now to FIG. 7, shown is a block diagram of a multi-domainprocessor in accordance with another embodiment of the presentinvention. As shown in the embodiment of FIG. 7, processor 500 includesmultiple domains. Specifically, a core domain 510 can include aplurality of cores 510 ₀-510 _(n), a graphics domain 520 can include oneor more graphics engines, and a system agent domain 550 may further bepresent. In some embodiments, system agent domain 550 may execute at anindependent frequency than the core domain and may remain powered on atall times to handle power control events and power management such thatdomains 510 and 520 can be controlled to dynamically enter into and exithigh power and low power states. Each of domains 510 and 520 may operateat different voltage and/or power. Note that while only shown with threedomains, understand the scope of the present invention is not limited inthis regard and additional domains can be present in other embodiments.For example, multiple core domains may be present each including atleast one core.

In general, each core 510 may further include low level caches inaddition to various execution units and additional processing elements.In turn, the various cores may be coupled to each other and to a sharedcache memory formed of a plurality of units of a last level cache (LLC)540 ₀-540 _(n). In various embodiments, LLC 540 may be shared amongstthe cores and the graphics engine, as well as various media processingcircuitry. As seen, a ring interconnect 530 thus couples the corestogether, and provides interconnection between the cores, graphicsdomain 520 and system agent circuitry 550. In one embodiment,interconnect 530 can be part of the core domain. However in otherembodiments the ring interconnect can be of its own domain.

As further seen, system agent domain 550 may include display controller552 which may provide control of and an interface to an associateddisplay. As further seen, system agent domain 550 may include a powercontrol unit 555 which can include an adaptive cache memory low powercontrol logic 559 in accordance with an embodiment of the presentinvention to dynamically and independently control sleep circuitsassociated with cache memory portions with independent optimal settingsbased at least in part on local process, voltage and temperatureconditions. In various embodiments, this logic may execute thealgorithms described above in FIGS. 2-3 and 5.

As further seen in FIG. 7, processor 500 can further include anintegrated memory controller (IMC) 570 that can provide for an interfaceto a system memory, such as a dynamic random access memory (DRAM).Multiple interfaces 580 ₀-580 _(n) may be present to enableinterconnection between the processor and other circuitry. For example,in one embodiment at least one direct media interface (DMI) interfacemay be provided as well as one or more Peripheral Component InterconnectExpress (PCI Express™ (PCIe™)) interfaces. Still further, to provide forcommunications between other agents such as additional processors orother circuitry, one or more interfaces in accordance with an Intel®Quick Path Interconnect (QPI) protocol may also be provided. Althoughshown at this high level in the embodiment of FIG. 7, understand thescope of the present invention is not limited in this regard.

Referring to FIG. 8, an embodiment of a processor including multiplecores is illustrated. Processor 1100 includes any processor orprocessing device, such as a microprocessor, an embedded processor, adigital signal processor (DSP), a network processor, a handheldprocessor, an application processor, a co-processor, a system on a chip(SOC), or other device to execute code. Processor 1100, in oneembodiment, includes at least two cores—cores 1101 and 1102, which mayinclude asymmetric cores or symmetric cores (the illustratedembodiment). However, processor 1100 may include any number ofprocessing elements that may be symmetric or asymmetric.

In one embodiment, a processing element refers to hardware or logic tosupport a software thread. Examples of hardware processing elementsinclude: a thread unit, a thread slot, a thread, a process unit, acontext, a context unit, a logical processor, a hardware thread, a core,and/or any other element, which is capable of holding a state for aprocessor, such as an execution state or architectural state. In otherwords, a processing element, in one embodiment, refers to any hardwarecapable of being independently associated with code, such as a softwarethread, operating system, application, or other code. A physicalprocessor typically refers to an integrated circuit, which potentiallyincludes any number of other processing elements, such as cores orhardware threads.

A core often refers to logic located on an integrated circuit capable ofmaintaining an independent architectural state, wherein eachindependently maintained architectural state is associated with at leastsome dedicated execution resources. In contrast to cores, a hardwarethread typically refers to any logic located on an integrated circuitcapable of maintaining an independent architectural state, wherein theindependently maintained architectural states share access to executionresources. As can be seen, when certain resources are shared and othersare dedicated to an architectural state, the line between thenomenclature of a hardware thread and core overlaps. Yet often, a coreand a hardware thread are viewed by an operating system as individuallogical processors, where the operating system is able to individuallyschedule operations on each logical processor.

Physical processor 1100, as illustrated in FIG. 8, includes two cores,cores 1101 and 1102. Here, cores 1101 and 1102 are considered symmetriccores, i.e., cores with the same configurations, functional units,and/or logic. In another embodiment, core 1101 includes an out-of-orderprocessor core, while core 1102 includes an in-order processor core.However, cores 1101 and 1102 may be individually selected from any typeof core, such as a native core, a software managed core, a core adaptedto execute a native instruction set architecture (ISA), a core adaptedto execute a translated ISA, a co-designed core, or other known core.Yet to further the discussion, the functional units illustrated in core1101 are described in further detail below, as the units in core 1102operate in a similar manner.

As depicted, core 1101 includes two hardware threads 1101 a and 1101 b,which may also be referred to as hardware thread slots 1101 a and 1101b. Therefore, software entities, such as an operating system, in oneembodiment potentially view processor 1100 as four separate processors,i.e., four logical processors or processing elements capable ofexecuting four software threads concurrently. As alluded to above, afirst thread is associated with architecture state registers 1101 a, asecond thread is associated with architecture state registers 1101 b, athird thread may be associated with architecture state registers 1102 a,and a fourth thread may be associated with architecture state registers1102 b. Here, each of the architecture state registers (1101 a, 1101 b,1102 a, and 1102 b) may be referred to as processing elements, threadslots, or thread units, as described above. As illustrated, architecturestate registers 1101 a are replicated in architecture state registers1101 b, so individual architecture states/contexts are capable of beingstored for logical processor 1101 a and logical processor 1101 b. Incore 1101, other smaller resources, such as instruction pointers andrenaming logic in allocator and renamer block 1130 may also bereplicated for threads 1101 a and 1101 b. Some resources, such asre-order buffers in reorder/retirement unit 1135, ILTB 1120, load/storebuffers, and queues may be shared through partitioning. Other resources,such as general purpose internal registers, page-table base register(s),low-level data-cache and data-TLB 1115, execution unit(s) 1140, andportions of out-of-order unit 1135 are potentially fully shared.

Processor 1100 often includes other resources, which may be fullyshared, shared through partitioning, or dedicated by/to processingelements. In FIG. 8, an embodiment of a purely exemplary processor withillustrative logical units/resources of a processor is illustrated. Notethat a processor may include, or omit, any of these functional units, aswell as include any other known functional units, logic, or firmware notdepicted. As illustrated, core 1101 includes a simplified,representative out-of-order (OOO) processor core. But an in-orderprocessor may be utilized in different embodiments. The OOO coreincludes a branch target buffer 1120 to predict branches to beexecuted/taken and an instruction-translation buffer (I-TLB) 1120 tostore address translation entries for instructions.

Core 1101 further includes decode module 1125 coupled to fetch unit 1120to decode fetched elements. Fetch logic, in one embodiment, includesindividual sequencers associated with thread slots 1101 a, 1101 b,respectively. Usually core 1101 is associated with a first ISA, whichdefines/specifies instructions executable on processor 1100. Oftenmachine code instructions that are part of the first ISA include aportion of the instruction (referred to as an opcode), whichreferences/specifies an instruction or operation to be performed. Decodelogic 1125 includes circuitry that recognizes these instructions fromtheir opcodes and passes the decoded instructions on in the pipeline forprocessing as defined by the first ISA. For example, decoders 1125, inone embodiment, include logic designed or adapted to recognize specificinstructions, such as transactional instruction. As a result of therecognition by decoders 1125, the architecture or core 1101 takesspecific, predefined actions to perform tasks associated with theappropriate instruction. It is important to note that any of the tasks,blocks, operations, and methods described herein may be performed inresponse to a single or multiple instructions; some of which may be newor old instructions.

In one example, allocator and renamer block 1130 includes an allocatorto reserve resources, such as register files to store instructionprocessing results. However, threads 1101 a and 1101 b are potentiallycapable of out-of-order execution, where allocator and renamer block1130 also reserves other resources, such as reorder buffers to trackinstruction results. Unit 1130 may also include a register renamer torename program/instruction reference registers to other registersinternal to processor 1100. Reorder/retirement unit 1135 includescomponents, such as the reorder buffers mentioned above, load buffers,and store buffers, to support out-of-order execution and later in-orderretirement of instructions executed out-of-order.

Scheduler and execution unit(s) block 1140, in one embodiment, includesa scheduler unit to schedule instructions/operation on execution units.For example, a floating point instruction is scheduled on a port of anexecution unit that has an available floating point execution unit.Register files associated with the execution units are also included tostore information instruction processing results. Exemplary executionunits include a floating point execution unit, an integer executionunit, a jump execution unit, a load execution unit, a store executionunit, and other known execution units.

Lower level data cache and data translation buffer (D-TLB) 1150 arecoupled to execution unit(s) 1140. The data cache is to store recentlyused/operated on elements, such as data operands, which are potentiallyheld in memory coherency states. The D-TLB is to store recentvirtual/linear to physical address translations. As a specific example,a processor may include a page table structure to break physical memoryinto a plurality of virtual pages

Here, cores 1101 and 1102 share access to higher-level or further-outcache 1110, which is to cache recently fetched elements. Note thathigher-level or further-out refers to cache levels increasing or gettingfurther away from the execution unit(s). In one embodiment, higher-levelcache 1110 is a last-level data cache—last cache in the memory hierarchyon processor 1100—such as a second or third level data cache. However,higher level cache 1110 is not so limited, as it may be associated withor includes an instruction cache. A trace cache—a type of instructioncache—instead may be coupled after decoder 1125 to store recentlydecoded traces.

In the depicted configuration, processor 1100 also includes businterface module 1105 and a power controller 1160, which may performpower sharing control in accordance with an embodiment of the presentinvention. Historically, controller 1170 has been included in acomputing system external to processor 1100. In this scenario, businterface 1105 is to communicate with devices external to processor1100, such as system memory 1175, a chipset (often including a memorycontroller hub to connect to memory 1175 and an I/O controller hub toconnect peripheral devices), a memory controller hub, a northbridge, orother integrated circuit. And in this scenario, bus 1105 may include anyknown interconnect, such as multi-drop bus, a point-to-pointinterconnect, a serial interconnect, a parallel bus, a coherent (e.g.cache coherent) bus, a layered protocol architecture, a differentialbus, and a GTL bus.

Memory 1175 may be dedicated to processor 1100 or shared with otherdevices in a system. Common examples of types of memory 1175 includeDRAM, SRAM, non-volatile memory (NV memory), and other known storagedevices. Note that device 1180 may include a graphic accelerator,processor or card coupled to a memory controller hub, data storagecoupled to an I/O controller hub, a wireless transceiver, a flashdevice, an audio controller, a network controller, or other knowndevice.

Note however, that in the depicted embodiment, the controller 1170 isillustrated as part of processor 1100. Recently, as more logic anddevices are being integrated on a single die, such as SOC, each of thesedevices may be incorporated on processor 1100. For example in oneembodiment, memory controller hub 1170 is on the same package and/or diewith processor 1100. Here, a portion of the core (an on-core portion)includes one or more controller(s) 1170 for interfacing with otherdevices such as memory 1175 or a graphics device 1180. The configurationincluding an interconnect and controllers for interfacing with suchdevices is often referred to as an on-core (or un-core configuration).As an example, bus interface 1105 includes a ring interconnect with amemory controller for interfacing with memory 1175 and a graphicscontroller for interfacing with graphics processor 1180. Yet, in the SOCenvironment, even more devices, such as the network interface,co-processors, memory 1175, graphics processor 1180, and any other knowncomputer devices/interface may be integrated on a single die orintegrated circuit to provide small form factor with high functionalityand low power consumption.

Embodiments may be implemented in many different system types. Referringnow to FIG. 9, shown is a block diagram of a system in accordance withan embodiment of the present invention. As shown in FIG. 9,multiprocessor system 600 is a point-to-point interconnect system, andincludes a first processor 670 and a second processor 680 coupled via apoint-to-point interconnect 650. As shown in FIG. 9, each of processors670 and 680 may be multicore processors, including first and secondprocessor cores (i.e., processor cores 674 a and 674 b and processorcores 684 a and 684 b), although potentially many more cores may bepresent in the processors. Each of the processors can include a PCU orother logic to independently and dynamically control low power statesfor a distributed cache memory, as described herein.

Still referring to FIG. 9, first processor 670 further includes a memorycontroller hub (MCH) 672 and point-to-point (P-P) interfaces 676 and678. Similarly, second processor 680 includes a MCH 682 and P-Pinterfaces 686 and 688. As shown in FIG. 9, MCH's 672 and 682 couple theprocessors to respective memories, namely a memory 632 and a memory 634,which may be portions of system memory (e.g., DRAM) locally attached tothe respective processors. First processor 670 and second processor 680may be coupled to a chipset 690 via P-P interconnects 662 and 664,respectively. As shown in FIG. 8, chipset 690 includes P-P interfaces694 and 698.

Furthermore, chipset 690 includes an interface 692 to couple chipset 690with a high performance graphics engine 638, by a P-P interconnect 639.In turn, chipset 690 may be coupled to a first bus 616 via an interface696. As shown in FIG. 9, various input/output (I/O) devices 614 may becoupled to first bus 616, along with a bus bridge 618 which couplesfirst bus 616 to a second bus 620. Various devices may be coupled tosecond bus 620 including, for example, a keyboard/mouse 622,communication devices 626 and a data storage unit 628 such as a diskdrive or other mass storage device which may include code 630, in oneembodiment. Further, an audio I/O 624 may be coupled to second bus 620.Embodiments can be incorporated into other types of systems includingmobile devices such as a smart cellular telephone, tablet computer,netbook, Ultrabook™, or so forth.

Referring now to FIG. 10, shown is a block diagram of a processor inaccordance with another embodiment of the present invention. In theembodiment of FIG. 10, processor 1000 may be a system on a chip (SoC)including multiple domains, each of which may be controlled to operateat an independent operating voltage and operating frequency. As aspecific illustrative example, processor 1000 may be an Intel®Architecture Core™-based processor such as an i3, i5, i7 or another suchprocessor available from Intel Corporation, Santa Clara, Calif. However,other low power processors such as available from Advanced MicroDevices, Inc. (AMD) of Sunnyvale, Calif., an ARM-based design from ARMHoldings, Ltd. or customer thereof or a MIPS-based design from MIPSTechnologies, Inc. of Sunnyvale, Calif., or their licensees or adoptersmay instead be present in other embodiments such as an Apple A5processor, a Qualcomm Snapdragon processor, or Texas Instruments OMAPprocessor. Such SoC may be used in a low power system such as asmartphone, tablet computer, Ultrabook™ computer or other portablecomputing device.

In the high level view shown in FIG. 10, processor 1000 includes aplurality of core units 1010 ₀-1010 _(n). Each core unit may include oneor more processor cores, one or more cache memories and other circuitry.Each core unit 1010 may support one or more instructions sets (e.g., thex86 instruction set (with some extensions that have been added withnewer versions); the MIPS instruction set of MIPS Technologies ofSunnyvale, Calif.; the ARM instruction set (with optional additionalextensions such as NEON) of ARM Holdings of Sunnyvale, Calif.) or otherinstruction set or combinations thereof. Note that some of the coreunits may be heterogeneous resources (e.g., of a different design). Inaddition, each such core may be coupled to a cache memory which in anembodiment may be a shared level (L2) cache memory. A non-volatilestorage 1030 may be used to store various program and other data. Forexample, this storage may be used to store at least portions ofmicrocode, boot information such as a BIOS, other system software or soforth.

Each core unit 1010 may also include an interface such as a businterface unit to enable interconnection to additional circuitry of theprocessor. In an embodiment, each core unit 1010 couples to a coherentfabric that may act as a primary cache coherent on-die interconnect thatin turn couples to a memory controller 1035. In turn, memory controller1035 controls communications with a memory such as a dynamic randomaccess memory (DRAM) (not shown for ease of illustration in FIG. 10).

In addition to core units, additional processing engines are presentwithin the processor, including at least one graphics unit 1020 whichmay include one or more graphics processing units (GPUs) to performgraphics processing as well as to possibly execute general purposeoperations on the graphics processor (so-called GPGPU operation). Inaddition, at least one image signal processor 1025 may be present.Signal processor 1025 may be configured to process incoming image datareceived from one or more capture devices, either internal to the SoC oroff-chip. Other accelerators also may be present. In the illustration ofFIG. 10, a video coder 1050 may perform coding operations includingencoding and decoding for video information, e.g., providing hardwareacceleration support for high definition video content. A displaycontroller 1055 further may be provided to accelerate display operationsincluding providing support for internal and external displays of asystem. In addition, a security processor 1045 may be present to performsecurity operations such as secure boot operations, various cryptographyoperations and so forth.

Each of the units may have its power consumption controlled via a powermanager 1040. Power manager 1040 includes control logic to perform theindependent and dynamic low power control for a distributed cache memoryas described herein.

In some embodiments, SoC 1000 may further include a non-coherent fabriccoupled to the coherent fabric to which various peripheral devices maycouple. One or more interfaces 1060 a-1060 d enable communication withone or more off-chip devices. Such communications may be according to avariety of communication protocols such as PCIe™ GPIO, USB, I2C, UART,MIPI, SDIO, DDR, SPI, HDMI, among other types of communicationprotocols. Although shown at this high level in the embodiment of FIG.10, understand the scope of the present invention is not limited in thisregard.

The following examples pertain to further embodiments.

In one example, a processor for controlling a voltage for a cache memorycomprises a plurality of cores each to independently executeinstructions, a cache memory including a plurality of portionsdistributed across a die of the processor, a plurality of sleep circuitseach coupled to one of the plurality of portions of the cache memory,and at least one sleep control logic coupled to the plurality ofportions of the cache memory to dynamically determine a sleep settingindependently for each of the plurality of sleep circuits, where thesleep control logic is to enable the corresponding sleep circuit tomaintain the corresponding cache memory portion at a retention voltage.

In an example, the sleep control logic is to dynamically determine thesleep setting based at least in part on a process, voltage, andtemperature associated with the corresponding portion of the cachememory.

In an example, the sleep control logic is to dynamically determine theretention voltage for the corresponding portion of the cache memorybased at least in part on the sleep setting.

In an example, the processor further comprises a power controller tocontrol power consumption of the processor, where the power controlleris to disable a first sleep circuit when a first portion of the cachememory coupled to the first sleep circuit is active.

In an example, the processor further comprises a plurality of processsensors associated with the first portion of the cache memory, where thesleep control logic is to dynamically determine the sleep setting forthe first sleep circuit based at least in part on information from theplurality of process sensors.

In an example, the processor further comprises a plurality of thermalsensors associated with the first portion of the cache memory, where thesleep control logic is to dynamically determine the sleep setting forthe first sleep circuit based at least in part on information from theplurality of thermal sensors.

In an example, the sleep control logic is to iteratively calculate aretention voltage and an operating voltage for a corresponding portionof the cache memory until an optimal sleep setting is determined.

In an example, the processor further comprises a plurality of sleepcontrol logics each coupled to one of the plurality of portions of thecache memory to dynamically determine the sleep setting independentlyfor the corresponding portion of the cache memory.

Note that the above processor can be implemented using various means.

In an example, the processor comprises a system on a chip (SoC)incorporated in a user equipment touch-enabled device.

In another example, a system comprises a display and a memory, andincludes the processor of one or more of the above examples.

In one example, a method for controlling a voltage for a cache memorycomprises calculating a retention voltage for a first portion of a cachememory of a processor based at least in part on a temperature and anoperating voltage associated with the first portion of the cache memory,where the retention voltage dynamically changes during operation of theprocessor, determining a sleep setting based on the retention voltage,and controlling a sleep circuit coupled to the first portion of thecache memory using the sleep setting to enable the first portion of thecache memory to be maintained in a low power state at a voltage levelabove the retention voltage.

In an example, calculating the retention voltage comprises receivingtest information from a plurality of test devices associated with thefirst portion of the cache memory, and determining a process corner forthe first portion of the cache memory based on the test information.

In an example, calculating the retention voltage further comprisesreceiving thermal information from a plurality of thermal sensorsassociated with a plurality of cores of the processor in proximity tothe first portion of the cache memory, and determining a localtemperature for the first portion of the cache memory based on thethermal information.

In an example, calculating the retention voltage further comprisesdynamically determining the retention voltage using the process corner,the local temperature, and the operating voltage associated with thefirst portion of the cache memory.

In an example, the method further comprises controlling the sleepcircuit to be disabled when the first portion of the cache memory is inan active state.

In an example, the method further comprises calculating the retentionvoltage for each of a plurality of portions of the cache memoryindependently, determining a sleep setting for each of the plurality ofportions of the cache memory independently, and controlling acorresponding sleep circuit for each of the plurality of portions of thecache memory independently using the corresponding sleep setting.

In an example, the method further comprises iteratively adjusting thesleep setting in a first direction while an operating voltage of thefirst portion of the cache memory exceeds a threshold voltage.

In an example, the method further comprises determining if the operatingvoltage of the first portion of the cache memory exceeds the retentionvoltage by a threshold value, and if so, adjusting the sleep setting ina first direction.

In an example, the method further comprises adjusting the sleep settingin a second direction if the operating voltage is less than a sum of theretention voltage and the threshold value.

In another example, a computer readable medium includes instructions toperform the method of any of the above examples.

In another example, an apparatus comprises means for performing themethod of any one of the above examples.

In one example, a system for controlling a cache memory voltagecomprises a multicore processor including a plurality of tiles, eachtile including a core, a portion of a cache memory, a sleep circuit andan agent to communicate between the tile and a power controller of themulticore processor, where the power controller is to dynamicallydetermine a sleep setting independently for the sleep circuit of each ofthe tiles and to communicate the independent sleep setting to the agentof each of the tiles, and the agent is to provide the independent sleepsetting to the sleep circuit to maintain the corresponding cache memoryportion at a retention voltage.

In an example, a first tile of the plurality of tiles is to communicatethermal information and voltage information of the first tile to thepower controller, and the power controller is to dynamically determinethe independent sleep setting for the first tile based at least in parton a process associated with the corresponding cache memory portion andthe thermal information and the voltage information.

In an example, the sleep circuit of each of the plurality of tilescomprises a selector to provide the independent sleep setting or astatic setting to a switch circuit of the sleep circuit to enable thesleep circuit to maintain the corresponding cache memory portion at theretention voltage.

In an example, the power controller is to iteratively calculate aretention voltage and an operating voltage for a corresponding portionof the cache memory until an optimal sleep setting is determined.

In an example, the power controller is to adjust the sleep setting in afirst direction while the operating voltage exceeds a threshold voltage,determine if the operating voltage exceeds the retention voltage by athreshold value and if so, adjust the sleep setting in the firstdirection, and adjust the sleep setting in a second direction if theoperating voltage is less than a sum of the retention voltage and thethreshold value.

Embodiments may be used in many different types of systems. For example,in one embodiment a communication device can be arranged to perform thevarious methods and techniques described herein. Of course, the scope ofthe present invention is not limited to a communication device, andinstead other embodiments can be directed to other types of apparatusfor processing instructions, or one or more machine readable mediaincluding instructions that in response to being executed on a computingdevice, cause the device to carry out one or more of the methods andtechniques described herein.

Embodiments may be implemented in code and may be stored on anon-transitory storage medium having stored thereon instructions whichcan be used to program a system to perform the instructions. The storagemedium may include, but is not limited to, any type of disk includingfloppy disks, optical disks, solid state drives (SSDs), compact diskread-only memories (CD-ROMs), compact disk rewritables (CD-RWs), andmagneto-optical disks, semiconductor devices such as read-only memories(ROMs), random access memories (RAMs) such as dynamic random accessmemories (DRAMs), static random access memories (SRAMs), erasableprogrammable read-only memories (EPROMs), flash memories, electricallyerasable programmable read-only memories (EEPROMs), magnetic or opticalcards, or any other type of media suitable for storing electronicinstructions.

While the present invention has been described with respect to a limitednumber of embodiments, those skilled in the art will appreciate numerousmodifications and variations therefrom. It is intended that the appendedclaims cover all such modifications and variations as fall within thetrue spirit and scope of this present invention.

What is claimed is:
 1. A processor comprising: a plurality of cores eachto independently execute instructions; a cache memory including aplurality of portions distributed across a die of the processor; aplurality of sleep circuits each coupled to one of the plurality ofportions of the cache memory; and at least one sleep control logiccoupled to the plurality of portions of the cache memory to dynamicallydetermine a sleep setting independently for each of the plurality ofsleep circuits based at least in part on a process, voltage, andtemperature associated with the corresponding portion of the cachememory and dynamically determine a retention voltage for thecorresponding portion of the cache memory based at least in part on thesleep setting, wherein the at least one sleep control logic is to enablethe corresponding sleep circuit to maintain the corresponding cachememory portion at the retention voltage.
 2. The processor of claim 1,further comprising a power controller to control power consumption ofthe processor, wherein the power controller is to disable a first sleepcircuit when a first portion of the cache memory coupled to the firstsleep circuit is active.
 3. The processor of claim 2, further comprisinga plurality of process sensors associated with the first portion of thecache memory.
 4. The processor of claim 3, further comprising aplurality of thermal sensors associated with the first portion of thecache memory.
 5. The processor of claim 1, wherein the at least onesleep control logic is to iteratively calculate a retention voltage andan operating voltage for a corresponding portion of the cache memoryuntil an optimal sleep setting is determined.
 6. The processor of claim1, further comprising a plurality of sleep control logics each coupledto one of the plurality of portions of the cache memory to dynamicallydetermine the sleep setting independently for the corresponding portionof the cache memory.
 7. A method comprising: dynamically calculating aretention voltage for a first portion of a cache memory of a processorbased at least in part on a process corner, a temperature and anoperating voltage associated with the first portion of the cache memory,wherein the retention voltage dynamically changes during operation ofthe processor; dynamically determining a sleep setting based on theretention voltage; and controlling a sleep circuit coupled to the firstportion of the cache memory using the sleep setting to enable the firstportion of the cache memory to be maintained in a low power state at avoltage level above the retention voltage.
 8. The method of claim 7,wherein dynamically calculating the retention voltage comprises:receiving test information from a plurality of test devices associatedwith the first portion of the cache memory; and determining the processcorner for the first portion of the cache memory based on the testinformation.
 9. The method of claim 8, wherein calculating the retentionvoltage further comprises: receiving thermal information from aplurality of thermal sensors associated with a plurality of cores of theprocessor in proximity to the first portion of the cache memory; anddetermining a local temperature for the first portion of the cachememory based on the thermal information.
 10. The method of claim 7,further comprising controlling the sleep circuit to be disabled when thefirst portion of the cache memory is in an active state.
 11. The methodof claim 7, further comprising: calculating the retention voltage foreach of a plurality of portions of the cache memory independently;determining a sleep setting for each of the plurality of portions of thecache memory independently; and controlling a corresponding sleepcircuit for each of the plurality of portions of the cache memoryindependently using the corresponding sleep setting.
 12. The method ofclaim 7, further comprising iteratively adjusting the sleep setting in afirst direction while an operating voltage of the first portion of thecache memory exceeds a threshold voltage.
 13. The method of claim 12,further comprising: determining if the operating voltage of the firstportion of the cache memory exceeds the retention voltage by a thresholdvalue; and if so, adjusting the sleep setting in the first direction.14. The method of claim 13, further comprising adjusting the sleepsetting in a second direction if the operating voltage is less than asum of the retention voltage and the threshold value.
 15. A systemcomprising: a multicore processor including a plurality of tiles, eachtile including a core, a portion of a cache memory, a sleep circuit andan agent to communicate between the tile and a power controller of themulticore processor, wherein the power controller is to dynamicallydetermine a sleep setting independently for the sleep circuit of each ofthe tiles and to communicate the independent sleep setting to the agentof each of the tiles, and the agent is to provide the independent sleepsetting to the sleep circuit to maintain the corresponding cache memoryportion at a retention voltage, wherein the sleep circuit of each of theplurality of tiles comprises a selector to provide the independent sleepsetting or a static setting to a switch circuit of the sleep circuit toenable the sleep circuit to maintain the corresponding cache memoryportion at the retention voltage.
 16. The system of claim 15, wherein afirst tile of the plurality of tiles is to communicate thermalinformation and voltage information of the first tile to the powercontroller, and the power controller is to dynamically determine theindependent sleep setting for the first tile based at least in part on aprocess associated with the corresponding cache memory portion and thethermal information and the voltage information.
 17. The system of claim15, wherein the power controller is to iteratively calculate a retentionvoltage and an operating voltage for a corresponding portion of thecache memory until an optimal sleep setting is determined.
 18. Thesystem of claim 17, wherein the power controller is to adjust the sleepsetting in a first direction while the operating voltage exceeds athreshold voltage, determine if the operating voltage exceeds theretention voltage by a threshold value and if so, adjust the sleepsetting in the first direction, and adjust the sleep setting in a seconddirection if the operating voltage is less than a sum of the retentionvoltage and the threshold value.